Services

Turnkey Monolithic Integration & Sensing Verification Platform Supporting cutting-edge research in multi-material optoelectronic detection:
InGaAs | Organic Semiconductors (OSCs) | Perovskites | 2D Materials (Graphene, TMDCs) | CQDs | MEMS Metasurfaces, and other emerging materials.

Services

END-TO-END SWIR ENGINEERING Platform

One-stop support covering materials, ROICs, SWIR sensors, prototype development, process integration, characterization, and technical services.

Multi-spec Array Substrates

Multi-spec Array Substrates

Material Synthesis

Material Synthesis

Monolithic Integration

Monolithic Integration

Imaging Chip Fabrication

Imaging Chip Fabrication

Wire Bonding

Wire Bonding

Integrated Packaging

Integrated Packaging

Reliability Testing (Hermeticity, Die Shear & Wire Bond Pull, Mechanical Shock & Vibration)

Reliability Testing (Hermeticity, Die Shear & Wire Bond Pull, Mechanical Shock & Vibration)

Imaging Modules

Imaging Modules

Performance Testing

Performance Testing

Certification & Failure Analysis (FA)

Certification & Failure Analysis (FA)

Global Partners

Global Partners
80+

Global academic & research partners

400+

University faculty & scientific researchers served

2,800+

Imaging tests completed

600+

Imaging chips processed & fabricated

InRight Tech's Monolithic Integration and Imaging Characterization Platform has supported numerous research projects resulting in publications in leading scientific journals.

Representative Publications by Our Customers

  • Nature Photonics
  • Nature Electronics
  • Nature Communications
  • Advanced Materials
  • Matter & Light and more...

Monolithic & Heterogeneous Integration Services

End-to-end micro/nano fabrication, die bonding, packaging, and reliability testing for monolithic and heterogeneous integrated imaging devices.

Thin-Film Deposition & Laser Patterning Thin-Film Deposition & Laser Patterning
Wire Bonding & Multi-Type Packaging Wire Bonding & Multi-Type Packaging
Hermeticity & Reliability Testing Hermeticity & Reliability Testing
Wafer-to-Wafer Bonding Wafer-to-Wafer Bonding
Die-to-Wafer Bonding Die-to-Wafer Bonding
Heterogeneous Integrated Chip Fabrication Heterogeneous Integrated Chip Fabrication

Imaging Characterization & Testing Services

Advanced SWIR imaging and optoelectronic characterization platforms for spatial, spectral, temporal, and quantum-efficiency testing of imaging chips and FPAs.

Single-Pixel Imaging Single-Pixel Imaging
Compressed Spectral Imaging Compressed Spectral Imaging
Compressed Temporal Imaging Compressed Temporal Imaging
Semiconductor Device Characterization & Testing Semiconductor Device Characterization & Testing
Detector Quantum Efficiency (DQE) Measurement Detector Quantum Efficiency (DQE) Measurement
Scintillator Light Yield Measurement Scintillator Light Yield Measurement

Contact Us

We welcome opportunities to collaborate with customers, researchers, and industry partners worldwide.

308, Guanggu Overseas Talent Innovation Park (Donghu Hi-tech Haichuangyuan), Wuhan, Hubei, P.R.China

Business Collaboration: zhangxiao@inrighttech.com

Media Collaboration: mjwu@inrighttech.com

Customer Service WeChat Customer Service WeChat
Customer Service WeChat WeChat Company Account

 

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