Home Services Semiconductor Device Characterization & Testing
Services
- Electrical characterization including I–V, dark current, photocurrent, turn-on voltage, and noise measurements
- Quantitative evaluation of leakage current, junction quality, and device interface performance
- Optoelectronic testing including External Quantum Efficiency (EQE), responsivity, detectivity (D*), spectral response, and response time
- Supports device performance benchmarking, process validation, and technology development
