Inspects sealed containers, liquid levels, and encapsulated electronics through SWIR-transparent plastics
SWIR Advantage: See-through capability for polymers; high-throughput, contactless quality control
Enables inspection of subsurface defects, cracks, and thickness variations in silicon and compound semiconductor wafers
SWIR Advantage: penetrates silicon; reveals hidden subsurface defects; non-destructive
Detects micro-cracks, inactive regions, and hidden electrical defects in photovoltaic cells
SWIR Advantage: high sensitivity to weak IR emission; non-destructive solar cell metrology; industry-proven method
We welcome opportunities to collaborate with customers, researchers, and industry partners worldwide.
3F, Optics Valley Overseas Talent Innovation Park, Jiayuan Road, Hongshan District, Wuhan, Hubei Province, China
No.1085, Meiquan Avenue,, Ou Hai District, Wen Zhou, Zhejiang Province, China
Business Collaboration: zhangxiao@inrighttech.com
Media Collaboration: mjwu@inrighttech.com
Customer Service WeChat
WeChat Company Account
"*" indicates required fields