InRight will be exhibiting at the 27th China International Optoelectronic Exposition

From Single Devices to CMOS Imaging: How Emerging Optoelectronic Materials Cross the Engineering Validation Gap

For decades, photodetector research has been evaluated against a relatively well-defined set of performance metrics: higher responsivity, lower dark current, higher specific detectivity, faster response speed, and broader spectral coverage. Continuous improvements in these parameters have driven advances in emerging materials, device architectures, and next-generation optoelectronic detectors. Today, however, as artificial intelligence moves rapidly into […]

Why Colloidal Quantum Dots Could Enable the Scalable Adoption of SWIR Imaging

Short-Wave Infrared (SWIR) imaging is widely recognized as one of the most promising sensing technologies beyond conventional visible vision. By capturing material-specific optical information, SWIR enables non-destructive inspection, material identification, and imaging in challenging environments, making it increasingly valuable for semiconductor inspection, machine vision, laser communications, agricultural sorting, and security monitoring. Despite these advantages, SWIR […]